In optical three-dimensional shape measurement, a method of improving the measurement precision for phase reconstruction without phase unwrapping is analyzed in detail. Intensities of any five consecutive pixels that lie in the x-axis direction of the phase domain are given. Partial derivatives of the phase function in the x- and y-axis directions are obtained with a phase-shifting mechanism, the origin of which is analysed. Furthermore, to avoid phase unwrapping in the phase reconstruction, we derive the gradient of the phase function and perform a two-dimensional integral along the x- and y-axis directions. The reconstructed phase can be obtained directly by performing numerical integration, and thus it is of great convenience for phase reconstruction. Finally, the results of numerical simulations and practical experiments verify the correctness of the proposed method.
In Fourier transform profilometry （FTP）, we must restrain spectrum overlapping caused by the nonlinearity of the charge coupled device （CCD） and increase the measurement accuracy of the object shape. Firstly, the causes of producing higher-order spectrum components and inducing spectrum overlapping are analysed theoretically, and a simple physical ex- planation and analytical deduction are given. Secondly, aiming to suppress spectrum overlapping and improve measurement accuracy, the influence of spatial carrier frequency of projection grating on them is analysed. A method of increasing the spatial carrier frequency of projection grating to restrain or reduce the spectrum overlapping significantly is proposed. We then analyze the mechanism of how the spectrum overlapping is reduced. Finally, the simulation results and experimental measurements verify the correction of the proposed theory and method.
