Electric-field-induced delay cracking of conducting notch in PZT-5H ferroelectric ceramics has been studied using a compact specimen with a notch filled in conductive silver paste. The critical electric field that induces instant failure of the PZT-5H specimen is shown to be EF = 14.7±3.2 kV/cm. When an electric field lower than EF, but higher than EDF = 9.9 kV/cm was applied, a micro-crack formed at the conductive notch tip instantly, propagating slowly until the specimen failure. When the electric field was lower than EDF, the micro-crack propagated a short distance, and then stopped. When the electric field was lower than EK=4.9 kV/cm, no cracks formed at the conductive notch tip instantly, however, a delay micro-crack would form and propagate. When the electric field was lower than EDK=2.4 kV/cm, no cracks formed and delay propagation occurred. A model for electric charge emission and concentration at a conductive notch is proposed to explain the delay cracking of conducting notch.
